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Resistivity of Semiconductors by Four Probe Method at Different Temperatures / Determination of Energy Band-Gap

Product Cat # PH1208

QTY


  • Equipment Setup Include
  • Four Probe Arrangement
  • Oven upto 3000C (manual heat controlled)
  • Sample - Ge. crystal mounted with spring loaded connections 
  • Thermometer (0-3000C).
  • Constant current power supply digital accuracy ±0.1% of the  reading 
  • ±1digit load regulation : 0.03% for no load , digital 
  • Millivoltmeter 0-200mV and 0-20m
  • Display : 3½ digit, 7 segment LED (12.5mm) height with auto polarity and decimal indication.
  • Equipment Setup Include
  • Four Probe Arrangement
  • Oven upto 3000C (manual heat controlled)
  • Sample - Ge. crystal mounted with spring loaded connections 
  • Thermometer (0-3000C).
  • Constant current power supply digital accuracy ±0.1% of the  reading 
  • ±1digit load regulation : 0.03% for no load , digital 
  • Millivoltmeter 0-200mV and 0-20m
  • Display : 3½ digit, 7 segment LED (12.5mm) height with auto polarity and decimal indication.

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